| Titolo | EMI-inducted failures in MOS power transistors |
| Publication Type | Conference Paper |
| Year of Publication | 2009 |
| Authors | Bona, C., and F. Fiori |
| Conference Name | International Conference on Electromagnetics in Advanced Applications (ICEAA '09) |
| Date Published | 09/2009 |
| Keywords | drain terminal, electromagnetic interference, electromagnetic wave interference, EMI-inducted failures, failure analysis, low-side configuration, MOS power transistors, power MOSFET, semiconductor device models, semiconductor device testing, small-signal models, susceptibility levels, time domain simulations, time-domain analysis |
| DOI | 10.1109/ICEAA.2009.5297367 |
