| Titolo | Analysis of failure mechanisms in velocity-matched distributed photodetectors |
| Publication Type | Journal Article |
| Year of Publication | 1999 |
| Authors | Nespola, A., T. Chau, M. C. Wu, and G. Ghione |
| Journal | Optoelectronics, IEE Proceedings - |
| Volume | 146 |
| Pagination | 25 -30 |
| Date Published | aug |
| ISSN | 1350-2433 |
| Keywords | 3D numerical electrothermal model, catastrophic failure, distributed detector, failure mechanisms, highly localised hot spot, increasing bias voltage, long-wavelength velocity-matched distributed photodetectors, metal-semiconductor-metal photodiodes, metal-semiconductor-metal structures, nonlinear thermal properties, nonuniform temperature rise, photodetector, photodetectors, photodiodes, self heating, semiconductor device models, semiconductor device reliability, thermal behaviour, thermal conductivity, thermal-runaway process, three-dimensional numerical electrothermal model, velocity-matched distributed photodetector |
| DOI | 10.1049/ip-opt:19990457 |
