Correlation between the failure mechanism and dark currents of high power photodetectors

TitoloCorrelation between the failure mechanism and dark currents of high power photodetectors
Publication TypeConference Paper
Year of Publication2000
AuthorsIslam, M. S., A. Nespola, M. Yeahia, M. C. Wu, D. L. Sivco, and A. Y. Cho
Conference NameLasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE
Keywordsdark conductivity, dark currents, effective barrier height, failure mechanism, fundamental parameters, high power photodetectors, photodetectors, photodiodes, reliability, theoretical model
DOI10.1109/LEOS.2000.890684
Applied Photonics