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Bona, C., and F. Fiori, "EMI-inducted failures in MOS power transistors", International Conference on Electromagnetics in Advanced Applications (ICEAA '09), pp. 564 -567, 09/2009.
Andriulli, F. P., H. Bagcı, F. Vipiana, G. Vecchi, and E. Michielssen, "Analysis and Regularization of the TD-EFIE Low-Frequency Breakdown", IEEE Transactions on Antennas and Propagation, vol. 57, no. 7, pp. 2034 -2046, 07/2009.